GAS ANALYSIS METHOD AND GAS ANALYSIS DEVICE

A gas analysis method includes irradiating a sample gas introduced into a gas cell with infrared light tuned to a wavelength corresponding to one absorption line of a target gas contained in the sample gas, measuring a sample signal value corresponding to intensity of transmitted light of the infrar...

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Bibliographic Details
Main Authors TAKAGI Shigeyuki, KUSABA Miyuki, MAEKAWA Akira, MAGARA Takashi, KAKUNO Tsutomu, SHIOMI Yasutomo, HASEGAWA Hiroshi
Format Patent
LanguageEnglish
Published 19.01.2017
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A gas analysis method includes irradiating a sample gas introduced into a gas cell with infrared light tuned to a wavelength corresponding to one absorption line of a target gas contained in the sample gas, measuring a sample signal value corresponding to intensity of transmitted light of the infrared light transmitted through the gas cell, evacuating the sample gas in the gas cell and then replacing by a reference gas, measuring a reference signal value corresponding to intensity of transmitted light of the infrared light transmitted through the reference gas, and calculating gas concentration at the one absorption line from ratio of the sample signal value to the reference signal value.
Bibliography:Application Number: US201515125092