ABNORMALITY DETECTING CIRCUIT AND ABNORMALITY DETECTING METHOD
There is provided an abnormality detecting circuit. A clamp unit is configured to clamp an output voltage which is output from another device, such that the upper limit of the output voltage becomes a first clamp voltage which is generated on the basis of a constant voltage generated from a power su...
Saved in:
Main Authors | , |
---|---|
Format | Patent |
Language | English |
Published |
29.12.2016
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | There is provided an abnormality detecting circuit. A clamp unit is configured to clamp an output voltage which is output from another device, such that the upper limit of the output voltage becomes a first clamp voltage which is generated on the basis of a constant voltage generated from a power supply voltage, or a second clamp voltage which is generated on the basis of the power supply voltage and which varies depending on the power supply voltage. A short-to-power detection unit is configured to compare the output voltage clamped by the clamp unit, with a predetermined threshold value which is generated on the basis of the power supply voltage, thereby detecting occurrence of a short to power. |
---|---|
AbstractList | There is provided an abnormality detecting circuit. A clamp unit is configured to clamp an output voltage which is output from another device, such that the upper limit of the output voltage becomes a first clamp voltage which is generated on the basis of a constant voltage generated from a power supply voltage, or a second clamp voltage which is generated on the basis of the power supply voltage and which varies depending on the power supply voltage. A short-to-power detection unit is configured to compare the output voltage clamped by the clamp unit, with a predetermined threshold value which is generated on the basis of the power supply voltage, thereby detecting occurrence of a short to power. |
Author | KIDO Keisuke KUME Masayoshi |
Author_xml | – fullname: KUME Masayoshi – fullname: KIDO Keisuke |
BookMark | eNrjYmDJy89L5WSwc3Ty8w_ydfTxDIlUcHENcXUO8fRzV3D2DHIO9QxRcPRzUcCuwtc1xMPfhYeBNS0xpziVF0pzMyi7uYY4e-imFuTHpxYXJCan5qWWxIcGGxkYmhmbm5uZmTkaGhOnCgAtoy0I |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
ExternalDocumentID | US2016377666A1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US2016377666A13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 15:30:31 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US2016377666A13 |
Notes | Application Number: US201615158168 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161229&DB=EPODOC&CC=US&NR=2016377666A1 |
ParticipantIDs | epo_espacenet_US2016377666A1 |
PublicationCentury | 2000 |
PublicationDate | 20161229 |
PublicationDateYYYYMMDD | 2016-12-29 |
PublicationDate_xml | – month: 12 year: 2016 text: 20161229 day: 29 |
PublicationDecade | 2010 |
PublicationYear | 2016 |
RelatedCompanies | FUJITSU TEN LIMITED |
RelatedCompanies_xml | – name: FUJITSU TEN LIMITED |
Score | 3.0748043 |
Snippet | There is provided an abnormality detecting circuit. A clamp unit is configured to clamp an output voltage which is output from another device, such that the... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING |
Title | ABNORMALITY DETECTING CIRCUIT AND ABNORMALITY DETECTING METHOD |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161229&DB=EPODOC&locale=&CC=US&NR=2016377666A1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5Kfd60Kj6qBJTegiUPsx6qJLupjZikpBupp5JkExAkLSbi33eytNqD9LgPhmFgZr9vd2YW4CYTyNByS6hFJpCgWLmhphgTVZKmCSl0IxX9pnbYD-5GsfE8Nact-FjVwsg-od-yOSJ6VIb-Xst4vfi7xGIyt7K6Td9xav445APWW7JjhC8aEmjmDNxxyELao3QQT3pBJNd0y0KwbiNX2mqAdNNp3311mrqUxfqhMjyA7THKK-tDaOVlB_bo6u-1Duz6yyfvDuzIHM2swsmlH1ZH8GA7QRj59ovH3xTmcpdyL3hSqBfR2OOKHTDl_x2-y0chO4brocvpSEWVZr8WmMWTdf31E2iX8zI_BSXp60IgPjY1kRikyIlFEN9oCII0QhKzOIPuJknnm5cvYL8ZNtkb2n0X2vXnV36JZ3CdXknT_QAYPoSz |
link.rule.ids | 230,309,786,891,25594,76906 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_G_JhvOhU_phaUvRVH29n4MKVLOltd27GlMp9K27QgSDdcxX_fa9h0D7LXu3Acgcv9fsndBeAmFcjQMlOoeSqQoJiZoSZ4JqokSWKS60YiOlXvsOffOaHxPO1Oa_Cx6oWRc0K_5XBEjKgU472U5_X87xKLydrKxW3yjqLZ44D3WHvJjhG-aEigWb9njwIW0DalvXDS9sdSp5smgnULudKWWc3nrcDTa7_qS5mvJ5XBPmyP0F5RHkAtK5rQoKu_15qw6y2fvJuwI2s00wUKl3G4OIQHq-8HY88auvxNYTa3KXf9J4W6Yxq6XLF8pvy_wrO5E7AjuB7YnDoquhT97kAUTtb914-hXsyK7ASUuKMLgfi4q4nYIHlGTIL4RkMQpBESd_NTaG2ydLZZfQUNh3vDaOj6L-ewV6mqSg7tvgX18vMru8B8XCaXcht_AHVuh6A |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=ABNORMALITY+DETECTING+CIRCUIT+AND+ABNORMALITY+DETECTING+METHOD&rft.inventor=KUME+Masayoshi&rft.inventor=KIDO+Keisuke&rft.date=2016-12-29&rft.externalDBID=A1&rft.externalDocID=US2016377666A1 |