ABNORMALITY DETECTING CIRCUIT AND ABNORMALITY DETECTING METHOD

There is provided an abnormality detecting circuit. A clamp unit is configured to clamp an output voltage which is output from another device, such that the upper limit of the output voltage becomes a first clamp voltage which is generated on the basis of a constant voltage generated from a power su...

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Bibliographic Details
Main Authors KUME Masayoshi, KIDO Keisuke
Format Patent
LanguageEnglish
Published 29.12.2016
Subjects
BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PULSE TECHNIQUE
TESTING
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Summary:There is provided an abnormality detecting circuit. A clamp unit is configured to clamp an output voltage which is output from another device, such that the upper limit of the output voltage becomes a first clamp voltage which is generated on the basis of a constant voltage generated from a power supply voltage, or a second clamp voltage which is generated on the basis of the power supply voltage and which varies depending on the power supply voltage. A short-to-power detection unit is configured to compare the output voltage clamped by the clamp unit, with a predetermined threshold value which is generated on the basis of the power supply voltage, thereby detecting occurrence of a short to power.
Bibliography:Application Number: US201615158168