SEMICONDUCTOR DEVICE STRUCTURE AND MANUFACTURING METHOD

The semiconductor device structures and methods for forming the same are provided. The semiconductor device structure includes a metal gate over a substrate. A first spacer is formed over sidewalls of the metal gate and having a first height. A second spacer is formed over the sidewalls of the metal...

Full description

Saved in:
Bibliographic Details
Main Authors CHEN Chih-Hsiao, LI Yao-Yu, HUANG Yi-lii, LIAO Chen-Liang
Format Patent
LanguageEnglish
Published 08.12.2016
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:The semiconductor device structures and methods for forming the same are provided. The semiconductor device structure includes a metal gate over a substrate. A first spacer is formed over sidewalls of the metal gate and having a first height. A second spacer is formed over the sidewalls of the metal gate and having a second height. The first height is higher than the second height. The first spacer is farther from the sidewalls of the metal gate than the second spacer. In addition, the semiconductor device structure includes a dielectric layer formed over the substrate to surround the first spacer and the metal gate.
Bibliography:Application Number: US201615243003