ROTATION DETECTION APPARATUS

• Main Authors: KOBAYASHI Atsushi, CHIKUAN Kenji
• Format: Patent
• Language: English
• Published: 10.11.2016
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; TARIFF METERING APPARATUS; TESTING

A rotation detection apparatus includes a signal detector and a determination circuit. The signal detector outputs a first signal and a second signal based on changes in respective resistance values of magnetoresistive element pairs. The first signal has a waveform corresponding to convexities and concavities of a rotor, while the second signal has a waveform differing in phase from the first signal. Upon receiving the first signal and second signal, the determination circuit compares each of the first signal and second signal against a binarization threshold value to generate a first binarized signal and a second binarized signal. The determination circuit permits output of the first binarized signal during one of a concavity period and a convexity period of the second binarized signal, and prohibits output of the first binarized signal during the other one of the concavity period and convexity period.