LOW RESISTANCE CONTACT FOR SEMICONDUCTOR DEVICES
A semiconductor device includes a substrate and a p-doped layer including a doped III-V material on the substrate. An n-type material is formed on or in the p-doped layer. The n-type layer includes ZnO. An aluminum contact is formed in direct contact with the ZnO of the n-type material to form an el...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
13.10.2016
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device includes a substrate and a p-doped layer including a doped III-V material on the substrate. An n-type material is formed on or in the p-doped layer. The n-type layer includes ZnO. An aluminum contact is formed in direct contact with the ZnO of the n-type material to form an electronic device. |
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Bibliography: | Application Number: US201615183336 |