SYSTEM AND METHOD OF ANALYZING INTEGRATED CIRCUIT IN CONSIDERATION OF A PROCESS VARIATION

A method of analyzing an integrated circuit, which is implemented by a computing system or a processor, wherein an interconnection of a first net of the integrated circuit includes at least one conducting segment corresponding to one wiring layer or one via, includes receiving a plurality of resista...

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Bibliographic Details
Main Authors Kim Moon-Su, Ha Naya, Hoover Andrew Paul, Kang Jong-Ku
Format Patent
LanguageEnglish
Published 29.09.2016
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:A method of analyzing an integrated circuit, which is implemented by a computing system or a processor, wherein an interconnection of a first net of the integrated circuit includes at least one conducting segment corresponding to one wiring layer or one via, includes receiving a plurality of resistances and a plurality of capacitances, which correspond to the first net, based on a process variation, counting a number of conducting segments corresponding to the first net, and calculating a first resistance or a first capacitance of the first net, based on the number of conducting segments, the plurality of resistances, and the plurality of capacitances.
Bibliography:Application Number: US201615081291