ELECTRICAL CIRCUIT ODOMETER SENSOR ARRAY

Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of sensor groups. Each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective o...

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Bibliographic Details
Main Authors SCHLICHTING KATHRYN E, FRY JONATHAN R, MCGAHAY VINCENT J, SMITH MELISSA A, KLABES CHRISTOPHER, MARTIN ANDREW J
Format Patent
LanguageEnglish
Published 23.06.2016
Subjects
GYROSCOPIC INSTRUMENTS
MEASURING
MEASURING DISTANCES, LEVELS OR BEARINGS
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
NAVIGATION
PHOTOGRAMMETRY OR VIDEOGRAMMETRY
PHYSICS
SURVEYING
TESTING
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Summary:Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of sensor groups. Each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective one of a plurality of failure mechanisms.
Bibliography:Application Number: US201414574746