System and Method for Contact Measurement Circuit

According to an embodiment, a contact measurement circuit is configured to be coupled between a first contact and a second contact, and the contact measurement circuit includes a first transistor, a control capacitor, and a voltage measurement unit. The first transistor includes a first conduction t...

Full description

Saved in:
Bibliographic Details
Main Authors MAUDER ANTON, BARRENSCHEEN JENS
Format Patent
LanguageEnglish
Published 16.06.2016
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:According to an embodiment, a contact measurement circuit is configured to be coupled between a first contact and a second contact, and the contact measurement circuit includes a first transistor, a control capacitor, and a voltage measurement unit. The first transistor includes a first conduction terminal configured to be coupled to the first contact, a second conduction terminal, and a first control terminal. The control capacitor includes a first capacitor terminal coupled to the second conduction terminal and a second capacitor terminal coupled to the first control terminal. The voltage measurement unit is coupled to the first capacitor terminal and the second capacitor terminal, and the second capacitor terminal is configured to be coupled to the second contact.
Bibliography:Application Number: US201414569418