COMPUTING DEVICE EXECUTING PROGRAM PERFORMING METHOD OF ANALYZING POWER NOISE IN SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE DESIGN METHOD, AND PROGRAM STORAGE MEDIUM STORING PROGRAM
A method of analyzing power noise in a semiconductor device includes; generating modified current information by modifying present current information based on a previous analysis result, updating a current vector based on the modified current information, and generating a present analysis result by...
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Format | Patent |
Language | English |
Published |
09.06.2016
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Online Access | Get full text |
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Abstract | A method of analyzing power noise in a semiconductor device includes; generating modified current information by modifying present current information based on a previous analysis result, updating a current vector based on the modified current information, and generating a present analysis result by calculating a voltage vector from the updated current vector. |
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AbstractList | A method of analyzing power noise in a semiconductor device includes; generating modified current information by modifying present current information based on a previous analysis result, updating a current vector based on the modified current information, and generating a present analysis result by calculating a voltage vector from the updated current vector. |
Author | HWANG CHAN SEOK CHEON YOUNG HOE |
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SubjectTerms | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
Title | COMPUTING DEVICE EXECUTING PROGRAM PERFORMING METHOD OF ANALYZING POWER NOISE IN SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE DESIGN METHOD, AND PROGRAM STORAGE MEDIUM STORING PROGRAM |
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