COMPUTING DEVICE EXECUTING PROGRAM PERFORMING METHOD OF ANALYZING POWER NOISE IN SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE DESIGN METHOD, AND PROGRAM STORAGE MEDIUM STORING PROGRAM

A method of analyzing power noise in a semiconductor device includes; generating modified current information by modifying present current information based on a previous analysis result, updating a current vector based on the modified current information, and generating a present analysis result by...

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Bibliographic Details
Main Authors CHEON YOUNG HOE, HWANG CHAN SEOK
Format Patent
LanguageEnglish
Published 09.06.2016
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A method of analyzing power noise in a semiconductor device includes; generating modified current information by modifying present current information based on a previous analysis result, updating a current vector based on the modified current information, and generating a present analysis result by calculating a voltage vector from the updated current vector.
Bibliography:Application Number: US201514959178