REFRACTIVE INDEX DISTRIBUTION MEASURING METHOD, REFRACTIVE INDEX DISTRIBUTION MEASURING APPARATUS, AND OPTICAL ELEMENT MANUFACTURING METHOD

A test unit is formed by sandwiching a test lens by a first reference lens whose shape and refractive index are known, a second reference lens whose shape and refractive index are known, and a medium. A wavefront of light transmitted through the test unit is measured, and, by using the shape and the...

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Bibliographic Details
Main Author SUGIMOTO TOMOHIRO
Format Patent
LanguageEnglish
Published 09.06.2016
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Summary:A test unit is formed by sandwiching a test lens by a first reference lens whose shape and refractive index are known, a second reference lens whose shape and refractive index are known, and a medium. A wavefront of light transmitted through the test unit is measured, and, by using the shape and the refractive index of the first reference lens, the shape and refractive index of the second reference lens, and the measured wavefront of the test unit, the refractive index distribution of the test lens is calculated.
Bibliography:Application Number: US201514959878