SCAN FLIP-FLOP

A pull cell scan flip-flop includes a scan flip-flop and a pull cell. The pull cell is configured to receive a scan flip-flop output signal from the scan flip-flop, the scan flip-flop output signal having a scan flip-flop output value. The pull cell is configured to receive a scan-enable signal and...

Full description

Saved in:
Bibliographic Details
Main Authors HSIEH WEN-WEN, TSENG NAN-HSIN, CHANGCHIEN WEI-PIN, LU CHUANG-HAO
Format Patent
LanguageEnglish
Published 31.03.2016
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:A pull cell scan flip-flop includes a scan flip-flop and a pull cell. The pull cell is configured to receive a scan flip-flop output signal from the scan flip-flop, the scan flip-flop output signal having a scan flip-flop output value. The pull cell is configured to receive a scan-enable signal and to generate a modified flip-flop output signal. The modified flip-flop output signal has a specified fixed value responsive to the scan-enable signal having a first logic value, and the modified flip-flop output signal has the scan flip-flop output value responsive to the scan-enable signal having a second logic value.
Bibliography:Application Number: US201414501475