SEMICONDUCTOR DEVICE AND TEST METHOD

According to one embodiment, there is provided a semiconductor device including a temperature detection circuit and a test circuit. The temperature detection circuit is configured to detect a temperature by comparing potential of a reference block and reference potential. The test circuit is configu...

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Bibliographic Details
Main Authors MATSUMOTO SHUUJI, HARA MAKOTO, OOTUKA HIROSI
Format Patent
LanguageEnglish
Published 26.11.2015
Subjects
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Summary:According to one embodiment, there is provided a semiconductor device including a temperature detection circuit and a test circuit. The temperature detection circuit is configured to detect a temperature by comparing potential of a reference block and reference potential. The test circuit is configured to test, in a test mode, an operation of the temperature detection circuit by serially switching a value of the reference potential to a value selected from a plurality of values, which is different from each other, while a temperature of the semiconductor device is kept at a first temperature.
Bibliography:Application Number: US201414479522