METHOD FOR CHARACTERISING PARTICLES BY IMAGE ANALYSIS

A method for characterizing particles including: producing at least one image of the particles of a sample with a scanning electron microscope, capturing and processing the image. The processing includes: for each usable particle, measuring maximum Feret length and minimum Feret width of same; defin...

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Bibliographic Details
Main Authors BERTRAND MURIELLE, BOICHARD BENOIT, DUGNE OLIVIER, BRACKX EMMANUELLE
Format Patent
LanguageEnglish
Published 22.10.2015
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A method for characterizing particles including: producing at least one image of the particles of a sample with a scanning electron microscope, capturing and processing the image. The processing includes: for each usable particle, measuring maximum Feret length and minimum Feret width of same; defining a geometric model of the particle from the maximum Feret length and minimum Feret width of same; calculating a projected area of the particle from the geometric model and the minimum Feret width of same; calculating a volume of the particle from the geometric model, the projected area and the maximum Feret length of same; calculating a characteristic particle size on the basis of the geometric model, the minimum Feret width and maximum Feret length; calculating a volume shape factor from the volume and characteristic size.
Bibliography:Application Number: US201314443571