COLLABORATIVE COMPUTER AIDED TEST PLAN GENERATION

Arrangements described herein relate to generation of test plans. A list of test case selection criteria can be presented to each of a plurality of stakeholders. At least one user input is received from each of the plurality of stakeholders selecting at least one test case selection criterion from t...

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Bibliographic Details
Main Authors MALDARI MARIO A, AKBULUT MUHTAR B
Format Patent
LanguageEnglish
Published 27.08.2015
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:Arrangements described herein relate to generation of test plans. A list of test case selection criteria can be presented to each of a plurality of stakeholders. At least one user input is received from each of the plurality of stakeholders selecting at least one test case selection criterion from the list of test case selection criteria and, for each selected test case selection criterion, assigning a criterion priority. Test cases, which correspond to the selected test case selection criteria, can be automatically selected to include in a candidate test plan. A candidate priority can be automatically assigned to each test case selected to be included in the candidate test plan. The processor selects the test cases to include in the candidate test plan and assigns the candidate priorities to the selected test cases based on processing the criterion priorities assigned to the selected test case selection criteria by the stakeholders.
Bibliography:Application Number: US201414189650