CHARGED PARTICLE BEAM APPARATUS

A charged particle beam apparatus includes a charged particle beam source which irradiates a sample with a charged particle beam, an electromagnetic lens, a lens control electric source for controlling strength of a convergence effect of the electromagnetic lens; and a phase compensation circuit whi...

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Main Authors TANIMOTO SAYAKA, FUKUDA MUNEYUKI, OBARA KENJI, MORITA KENICHI, SUZUKI NAOMASA, SAKAKIBARA MAKOTO
Format Patent
LanguageEnglish
Published 13.08.2015
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Summary:A charged particle beam apparatus includes a charged particle beam source which irradiates a sample with a charged particle beam, an electromagnetic lens, a lens control electric source for controlling strength of a convergence effect of the electromagnetic lens; and a phase compensation circuit which is connected to the lens control electric source in parallel with the electromagnetic lens, and controls a lens current at the time of switching the strength of the convergence effect of the electromagnetic lens such that the lens current monotonically increases or monotonically decreases.
Bibliography:Application Number: US201514616658