EXTENDED INPUT/OUTPUT MEASUREMENT WORD FACILITY FOR OBTAINING MEASUREMENT DATA IN AN EMULATED ENVIRONMENT

An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O respon...

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Bibliographic Details
Main Authors DYCK GREG A, CARLSON SCOTT M, RIEDY, JR. DALE F, TROTTER JOHN S, WYMAN LESLIE W, LU TAN, ROONEY WILLIAM J, YUDENFRIEND HARRY M, OAKES KENNETH J
Format Patent
LanguageEnglish
Published 16.07.2015
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
Bibliography:Application Number: US201514669140