Efficient Post Write Read in Three Dimensional Nonvolatile Memory

Data that is stored in a higher error rate format in a 3-D nonvolatile memory is backed up in a lower error rate format. Later, the higher error rate copy is sampled to determine if it is acceptable. A sampling pattern samples all word lines of a string and at least one word line of each string of t...

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Bibliographic Details
Main Authors AVILA CHRIS NGA YEE, CHEN JIAN, DUSIJA GAUTAM ASHOK
Format Patent
LanguageEnglish
Published 01.01.2015
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Summary:Data that is stored in a higher error rate format in a 3-D nonvolatile memory is backed up in a lower error rate format. Later, the higher error rate copy is sampled to determine if it is acceptable. A sampling pattern samples all word lines of a string and at least one word line of each string of the block.
Bibliography:Application Number: US201313929368