ADDRESS WINDOWING FOR AT-SPEED BITMAPPING WITH MEMORY BUILT-IN SELF-TEST

• Main Authors: VONREYN TIMOTHY J, RODRIGUEZ GEOVANNY, VINCENT BRIAN J
• Format: Patent
• Language: English
• Published: 04.12.2014
• Subjects: INFORMATION STORAGE; PHYSICS; STATIC STORES

Integrated circuits with memory built-in self-test (BIST) logic and methods of testing using the same are disclosed. The method includes setting an address window for locating defects in a memory array. The method further includes comparing output data of the memory array to expected data to determi...