ADDRESS WINDOWING FOR AT-SPEED BITMAPPING WITH MEMORY BUILT-IN SELF-TEST

• Main Authors: VONREYN TIMOTHY J, RODRIGUEZ GEOVANNY, VINCENT BRIAN J
• Format: Patent
• Language: English
• Published: 04.12.2014
• Subjects: INFORMATION STORAGE; PHYSICS; STATIC STORES

Integrated circuits with memory built-in self-test (BIST) logic and methods of testing using the same are disclosed. The method includes setting an address window for locating defects in a memory array. The method further includes comparing output data of the memory array to expected data to determine that a defect exists at location "M" in the memory array within the address window. The method further includes storing, in registers, the address M and a resultant bit fail vector associated with the location "M" of the defect found in the memory array. The method further includes resetting the registers to a null value and resetting the address window with a new minimum and maximum address pair, to compare the output data of the memory array to the expected data within the reset address window which excludes address M.