APPARATUS FOR MEASURING DISPLACEMENT

An apparatus for measuring displacement is disclosed. The disclosed displacement measurement apparatus may include a magnet unit having magnet sub-units arranged repeatedly in a particular pitch (p) to generate a sine-wave magnetic flux density; a sensor unit including a sensor array for measuring t...

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Bibliographic Details
Main Author AHN HYEONG-JOON
Format Patent
LanguageEnglish
Published 25.09.2014
Subjects
ELECTRICITY
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:An apparatus for measuring displacement is disclosed. The disclosed displacement measurement apparatus may include a magnet unit having magnet sub-units arranged repeatedly in a particular pitch (p) to generate a sine-wave magnetic flux density; a sensor unit including a sensor array for measuring the sine-wave magnetic flux density; and a measurement part configured to measure a displacement of the magnet unit and the sensor unit displaced relatively to each other, based on the measured value of the sine-wave magnetic flux density, where the sensor array comprises two or more sensors arranged separated by a gap of p/k in-between (where k is 2n, n is an integer greater than or equal to 1) along an arrangement direction of the magnet sub-units.
Bibliography:Application Number: US201314141531