DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

• Main Author: YANASE MASAKAZU
• Format: Patent
• Language: English
• Published: 03.07.2014
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; PICTORIAL COMMUNICATION, e.g. TELEVISION; TESTING

A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which p...