DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which p...

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Main Author YANASE MASAKAZU
Format Patent
LanguageEnglish
Published 03.07.2014
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Abstract A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which photographs an entire surface of the panel; a second infrared sensor which photographs a part of the panel; and sensor moving means for moving the second infrared sensor to each position on the panel, the first infrared sensor including a plurality of infrared cameras.
AbstractList A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which photographs an entire surface of the panel; a second infrared sensor which photographs a part of the panel; and sensor moving means for moving the second infrared sensor to each position on the panel, the first infrared sensor including a plurality of infrared cameras.
Author YANASE MASAKAZU
Author_xml – fullname: YANASE MASAKAZU
BookMark eNrjYmDJy89L5WQwdXF1c3UOUfD0Cw4A0p7-fgourmGezq4Kjn4uCpiSvq4hHv4uPAysaYk5xam8UJqbQdnNNcTZQze1ID8-tbggMTk1L7UkPjTYyMDQxNDCxNzCxNHQmDhVAHooKi4
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID US2014184784A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2014184784A13
IEDL.DBID EVB
IngestDate Fri Jul 19 12:47:29 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2014184784A13
Notes Application Number: US201214126016
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140703&DB=EPODOC&CC=US&NR=2014184784A1
ParticipantIDs epo_espacenet_US2014184784A1
PublicationCentury 2000
PublicationDate 20140703
PublicationDateYYYYMMDD 2014-07-03
PublicationDate_xml – month: 07
  year: 2014
  text: 20140703
  day: 03
PublicationDecade 2010
PublicationYear 2014
RelatedCompanies SHARP KABUSHIKI KAISHA
YANASE MASAKAZU
RelatedCompanies_xml – name: SHARP KABUSHIKI KAISHA
– name: YANASE MASAKAZU
Score 2.9404247
Snippet A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies...
SourceID epo
SourceType Open Access Repository
SubjectTerms ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
TESTING
Title DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140703&DB=EPODOC&locale=&CC=US&NR=2014184784A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3da8IwED_Efb5tbmMfbhQ2-lZGbWrqQxmapHQDtcxWfJNYUxBGlbVj__6uoW7CwMfcwXE5crn7JXcJwFNKFxgEetRSKZUWoUpaPVdKS9oOdbIOdYlT9Q4PR90wIW8zd9aAj20vjH4n9Fs_jogelaK_l3q_3vwdYnFdW1k8L1ZIWr8Esc_NGh0jWsAVbPKBL6IxHzOTMT-ZmKN3zUMwQz3SR6x0gIk0rfxBTAdVX8pmN6gEZ3AYoby8PIeGyltwwrZ_r7XgeFhfebfgSNdopgUSaz8sLsDlIhAsNhB6R0KXgRhcTF-ZMPojbvxnDkUcjvklPAYiZqGFmsx_Jz5PJrtqO1fQzNe5uq4arZdLO8u6dobG9IjEHAdRLrGlUinpLL0baO-TdLuffQen1VAXpTptaJafX-oeQ2-5eNAW-wFFXIE9
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3da8IwED_Efbi3zW24zW2Fjb6VUZsafZChSUrdbJVZxTdJawqDUWV27N_fNegmDHy9g-Ny5HL3S-4uAI8JjTEItKmlEiotQpW02q6UlrQd6qQN6hKn6B0OwqY_IS8zd1aCj20vjJ4T-q2HI6JHJejvuT6vV3-XWFzXVq6f4nckLZ-9qMPNDTpGtIA72OS9jhgN-ZCZjHUmYzN80zwEM7RFuoiVDjDJpoU_iGmv6EtZ7QYV7xQORygvy8-gpLIqVNj277UqHAebJ-8qHOkazWSNxI0frs_B5cITLDIQeo-ELgMxuJj2mTC6ITf-MwMR-UN-AQ-eiJhvoSbz34XPJ-NdtZ1LKGfLTNWKRuvFwk7Tpp2iMVtEYo6DKJfYUqmENBatK6jvk3S9n30PFT8KBvNBP3y9gZOCpQtUnTqU888vdYthOI_vtPV-AIDWhDA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=DEFECT+INSPECTION+DEVICE+AND+DEFECT+INSPECTION+METHOD&rft.inventor=YANASE+MASAKAZU&rft.date=2014-07-03&rft.externalDBID=A1&rft.externalDocID=US2014184784A1