DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which p...
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Format | Patent |
Language | English |
Published |
03.07.2014
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Subjects | |
Online Access | Get full text |
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Abstract | A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which photographs an entire surface of the panel; a second infrared sensor which photographs a part of the panel; and sensor moving means for moving the second infrared sensor to each position on the panel, the first infrared sensor including a plurality of infrared cameras. |
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AbstractList | A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which photographs an entire surface of the panel; a second infrared sensor which photographs a part of the panel; and sensor moving means for moving the second infrared sensor to each position on the panel, the first infrared sensor including a plurality of infrared cameras. |
Author | YANASE MASAKAZU |
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RelatedCompanies | SHARP KABUSHIKI KAISHA YANASE MASAKAZU |
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Snippet | A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies... |
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SubjectTerms | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING |
Title | DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD |
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