LAYERED SEMICONDUCTOR SUBSTRATE AND METHOD FOR MANUFACTURING IT

A layered semiconductor substrate has a monocrystalline first layer based on silicon, having a first thickness and a first lattice constant a1 determined by a first dopant element and a first dopant concentration, and in direct contact therewith, a monocrystalline second layer based on silicon, havi...

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Main Authors THAPA SARAD BAHADUR, SCHWENK HELMUT, DREIER PETER, STORCK PETER, SACHS GUENTER, MUEMMLER FRANK, ROTHAMMER UTE, MAYRHUBER RUDOLF
Format Patent
LanguageEnglish
Published 20.02.2014
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Summary:A layered semiconductor substrate has a monocrystalline first layer based on silicon, having a first thickness and a first lattice constant a1 determined by a first dopant element and a first dopant concentration, and in direct contact therewith, a monocrystalline second layer based on silicon, having a second thickness and a second lattice constant a2, determined by a second dopant element and a second dopant concentration, and a monocrystalline third layer comprising a group III nitride, the second layer located between the first layer and the third layer, wherein a2>a1, wherein the crystal lattice of the first layer and the second layer are lattice-matched, and wherein the bow of the layered semiconductor substrate is in the range from -50 mum to 50 mum.
Bibliography:Application Number: US201214114056