INTEGRATED CIRCUIT WITH AUTOMATIC TOTAL IONIZING DOSE (TID) EXPOSURE DEACTIVATION

Integrated circuits and methods for deactivating user circuit operation with one or more wide channel sensing transistors biased to an on condition for exposure to total ionizing dose and then to an off condition for measurement and comparison of a leakage current or threshold voltage parameter to a...

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Bibliographic Details
Main Authors BAUMANN ROBERT CHRISTOPHER, CARULLI, JR. JOHN MICHAEL
Format Patent
LanguageEnglish
Published 19.12.2013
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SWITCHES
ELECTRICITY
EMERGENCY PROTECTIVE DEVICES
RELAYS
SELECTORS
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Summary:Integrated circuits and methods for deactivating user circuit operation with one or more wide channel sensing transistors biased to an on condition for exposure to total ionizing dose and then to an off condition for measurement and comparison of a leakage current or threshold voltage parameter to a predetermined reference, and a deactivation circuit selectively disables operation of the user circuit if the sensed parameter is greater than or equal to the reference.
Bibliography:Application Number: US201213517730