Transistor Overcurrent Detection
Circuits and methods for overcurrent fault detection using a debounce timer to qualify the presence of an overcurrent fault based on an overcurrent signal being asserted for at least a predetermined time interval. The debounce timer may be used in conjunction with state-qualified fault sensing and/o...
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Format | Patent |
Language | English |
Published |
28.11.2013
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Subjects | |
Online Access | Get full text |
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Abstract | Circuits and methods for overcurrent fault detection using a debounce timer to qualify the presence of an overcurrent fault based on an overcurrent signal being asserted for at least a predetermined time interval. The debounce timer may be used in conjunction with state-qualified fault sensing and/or blank-time-qualified fault sensing. |
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AbstractList | Circuits and methods for overcurrent fault detection using a debounce timer to qualify the presence of an overcurrent fault based on an overcurrent signal being asserted for at least a predetermined time interval. The debounce timer may be used in conjunction with state-qualified fault sensing and/or blank-time-qualified fault sensing. |
Author | CHRISTIE ROBERT DOUGLAS |
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RelatedCompanies | ALLEGRO MICROSYSTEMS, INC CHRISTIE ROBERT DOUGLAS |
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Snippet | Circuits and methods for overcurrent fault detection using a debounce timer to qualify the presence of an overcurrent fault based on an overcurrent signal... |
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Title | Transistor Overcurrent Detection |
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