Transistor Overcurrent Detection

Circuits and methods for overcurrent fault detection using a debounce timer to qualify the presence of an overcurrent fault based on an overcurrent signal being asserted for at least a predetermined time interval. The debounce timer may be used in conjunction with state-qualified fault sensing and/o...

Full description

Saved in:
Bibliographic Details
Main Author CHRISTIE ROBERT DOUGLAS
Format Patent
LanguageEnglish
Published 28.11.2013
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:Circuits and methods for overcurrent fault detection using a debounce timer to qualify the presence of an overcurrent fault based on an overcurrent signal being asserted for at least a predetermined time interval. The debounce timer may be used in conjunction with state-qualified fault sensing and/or blank-time-qualified fault sensing.
Bibliography:Application Number: US201213479804