WAFER FILL PATTERNS AND USES
A semiconductor device includes an active region including an element formed in a double etch, double exposure method and an inactive region including one or more fills, at least one of the one or more fills including a cut-away hole formed therein, where the cut-away holes expose a layer in the ina...
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Main Authors | , , , , , , |
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Format | Patent |
Language | English |
Published |
18.07.2013
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device includes an active region including an element formed in a double etch, double exposure method and an inactive region including one or more fills, at least one of the one or more fills including a cut-away hole formed therein, where the cut-away holes expose a layer in the inactive region used for an endpoint detection. |
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Bibliography: | Application Number: US201313788776 |