Doped Tantalum Nitride for Copper Barrier Applications

Described are doped TaN films, as well as methods for providing the doped TaN films. Doping TaN films with Ru, Cu, Co, Mn, Al, Mg, Cr, Nb, Ti and/or V allows for enhanced copper barrier properties of the TaN films. Also described are methods of providing films with a first layer comprising doped TaN...

Full description

Saved in:
Bibliographic Details
Main Authors MA PAUL F, CHANG MEI, LAKSHMANAN ANNAMALAI, SHAN JENNIFER
Format Patent
LanguageEnglish
Published 06.06.2013
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Described are doped TaN films, as well as methods for providing the doped TaN films. Doping TaN films with Ru, Cu, Co, Mn, Al, Mg, Cr, Nb, Ti and/or V allows for enhanced copper barrier properties of the TaN films. Also described are methods of providing films with a first layer comprising doped TaN and a second layer comprising one or more of Ru and Co, with optional doping of the second layer.
AbstractList Described are doped TaN films, as well as methods for providing the doped TaN films. Doping TaN films with Ru, Cu, Co, Mn, Al, Mg, Cr, Nb, Ti and/or V allows for enhanced copper barrier properties of the TaN films. Also described are methods of providing films with a first layer comprising doped TaN and a second layer comprising one or more of Ru and Co, with optional doping of the second layer.
Author MA PAUL F
CHANG MEI
LAKSHMANAN ANNAMALAI
SHAN JENNIFER
Author_xml – fullname: MA PAUL F
– fullname: CHANG MEI
– fullname: LAKSHMANAN ANNAMALAI
– fullname: SHAN JENNIFER
BookMark eNrjYmDJy89L5WQwc8kvSE1RCEnMK0nMKc1V8MssKcpMSVVIyy9ScM4vKEgtUnBKLCrKBNKOBQU5mcmJJZn5ecU8DKxpiTnFqbxQmptB2c01xNlDN7UgPz61uCAxOTUvtSQ-NNjIwNDY0MTAzNLC0dCYOFUAMAMv8g
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID US2013140698A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2013140698A13
IEDL.DBID EVB
IngestDate Fri Jul 19 15:31:44 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2013140698A13
Notes Application Number: US201213689871
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130606&DB=EPODOC&CC=US&NR=2013140698A1
ParticipantIDs epo_espacenet_US2013140698A1
PublicationCentury 2000
PublicationDate 20130606
PublicationDateYYYYMMDD 2013-06-06
PublicationDate_xml – month: 06
  year: 2013
  text: 20130606
  day: 06
PublicationDecade 2010
PublicationYear 2013
RelatedCompanies MA PAUL F
CHANG MEI
LAKSHMANAN ANNAMALAI
SHAN JENNIFER
RelatedCompanies_xml – name: LAKSHMANAN ANNAMALAI
– name: SHAN JENNIFER
– name: CHANG MEI
– name: MA PAUL F
Score 2.8924348
Snippet Described are doped TaN films, as well as methods for providing the doped TaN films. Doping TaN films with Ru, Cu, Co, Mn, Al, Mg, Cr, Nb, Ti and/or V allows...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title Doped Tantalum Nitride for Copper Barrier Applications
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130606&DB=EPODOC&locale=&CC=US&NR=2013140698A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFPVNp-LHlIDSt-I-utY-FNn6wRDWDbfK3kbSXmEw29J1-O97qZ32aZCHkIOQBO5-d0l-dwDPGIXmQItQ7emRDFCMWOWmEalIcCF43DVjIQnOE18fB9r7crBswGbPhSnzhH6XyRFJo0LS96K019n_JZZT_q3cvog1DaVv3sJylCo6JoNMDrnijCx3NnWmtmLbVjBX_I9S1pUsz9chxUpH5EgbUh_cz5HkpWR1UPHO4XhG8yXFBTQwacGpva-91oKTSfXkTd1K-7aXoDtphhFbcMlg3H0xf13ktAdGfiez0yzDnI14LkvQsWHtXfoKnjx3YY9VWsDqb7-rYF5fbf8amkma4A0wAncURoym0EINDUN0uI56B8M-ct4ztVtoH5rp7rD4Hs56v7UeqLWhWeQ7fCDELcRjeVA_SQ-FQw
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3fS8MwED7GFOebTsXp1IDSt-J-dK19GLK1HVO3brhW9jaS9goDbUvX4b_vpW66p0EeQg5CErj77pJ8dwAPGAZmRwtRbemhDFCMSOWmEapIcCF41DQjIQnOY1cf-trrvDMvweeWC1PkCf0ukiOSRgWk73lhr9P_Syy7-Fu5ehRLGkqeB17XVjbRMRlkcsgVu991phN7YimW1fVnivteyJqS5fnUo1jpgJxsQ-qD89GXvJR0F1QGJ3A4pfni_BRKGFehYm1rr1XhaLx58qbuRvtWZ6DbSYoh87hkMK6_mLvMM9oDI7-TWUmaYsb6PJMl6Fhv5136HO4HjmcNVVrA4m-_C3-2u9r2BZTjJMZLYATuKIwITaEFGhqGaHAd9QYGbeS8ZWo1qO-b6Wq_-A4qQ288Woxe3LdrOG791n2gVodynq3xhtA3F7fFof0AtHSINg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Doped+Tantalum+Nitride+for+Copper+Barrier+Applications&rft.inventor=MA+PAUL+F&rft.inventor=CHANG+MEI&rft.inventor=LAKSHMANAN+ANNAMALAI&rft.inventor=SHAN+JENNIFER&rft.date=2013-06-06&rft.externalDBID=A1&rft.externalDocID=US2013140698A1