TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND APPARATUS USING SAME

In one embodiment, an interface includes a plurality of test electronics to DUT interfaces. Each test electronics to DUT interface has at least one test electronics interface, at least one DUT interface, and an electrical coupling between the at least one test electronics interface and the at least...

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Bibliographic Details
Main Authors GROVER SANJEEV, ANDBERG JOHN W, CHIU DONALD W
Format Patent
LanguageEnglish
Published 30.05.2013
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:In one embodiment, an interface includes a plurality of test electronics to DUT interfaces. Each test electronics to DUT interface has at least one test electronics interface, at least one DUT interface, and an electrical coupling between the at least one test electronics interface and the at least one DUT interface. First and second subsets of the DUT interfaces are respectively positioned along the perimeters of first and second concentric shapes.
Bibliography:Application Number: US201313742183