SUPPRESSING TIN WHISKER GROWTH IN LEAD-FREE SOLDERS AND PLATNGS
A process of irradiation Sn containing Pb-free solder to mitigate whisker formation and growth thereon is provided. The use of gamma radiation such as cobalt-60 has been applied to a substrate of Sn on copper has been found to change the morphology of the crystalline whisker growth to a more truncat...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
11.04.2013
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Subjects | |
Online Access | Get full text |
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Summary: | A process of irradiation Sn containing Pb-free solder to mitigate whisker formation and growth thereon is provided. The use of gamma radiation such as cobalt-60 has been applied to a substrate of Sn on copper has been found to change the morphology of the crystalline whisker growth to a more truncated hillock pattern. The change in morphology greatly reduces the tendency of whiskers to contribute to electrical short-circuits being used as a Pb-free solder system on a copper substrate. |
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Bibliography: | Application Number: US201113269803 |