Semiconductor Devices Including Dual Gate Electrode Structures And Related Methods
A semiconductor device may include a semiconductor substrate with first and second spaced apart source/drain regions defining a channel region therebetween and a control gate structure on the channel region between the first and second spaced apart source/drain regions. More particularly, the contro...
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Main Authors | , , , , , , , |
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Format | Patent |
Language | English |
Published |
29.11.2012
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device may include a semiconductor substrate with first and second spaced apart source/drain regions defining a channel region therebetween and a control gate structure on the channel region between the first and second spaced apart source/drain regions. More particularly, the control gate structure may include a first gate electrode on the channel region adjacent the first source/drain region, and a second gate electrode on the channel region adjacent the second source/drain region. Moreover, the first and second gate electrodes may be electrically isolated. Related devices, structures, methods of operation, and methods of fabrication are also discussed. |
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Bibliography: | Application Number: US201113298644 |