System and Method for Analyzing an Electronics Device Including a Logic Analyzer

A system for testing or debugging a device under test having an embedded logic analyzer. In one embodiment, the system includes software stored in non-transitory memory for testing a device under test having an embedded logic analyzer, the software program product having instructions which, when exe...

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Bibliographic Details
Main Authors WARD JAMES ALAN, SHARPE JAMES PATRICK, CASE CHRISTOPHER W, MARRA, III MICHAEL ANTHONY, BAILEY JAMES RAY
Format Patent
LanguageEnglish
Published 07.06.2012
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A system for testing or debugging a device under test having an embedded logic analyzer. In one embodiment, the system includes software stored in non-transitory memory for testing a device under test having an embedded logic analyzer, the software program product having instructions which, when executed by a computing device associated with the device under test cause the computing device to reconstruct signals of interest in the device under test based at least in part upon signals captured by the embedded logic analyzer during the test or debug session, and cause the computing device to display the reconstructed signals of interest to a user of the computing device.
Bibliography:Application Number: US201113308286