METHODS AND APPARATUS TO COLLECT PROCESS CONTROL DATA

Methods, apparatus, and articles of manufacture to collect process control data are disclosed. An example method to collect process control data includes registering an electronic device description describing a parameter to be measured and a measurement sampling rate, measuring the parameter based...

Full description

Saved in:
Bibliographic Details
Main Authors NIXON MARK, BLEVINS TERRY
Format Patent
LanguageEnglish
Published 15.03.2012
Subjects
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
Online AccessGet full text

Cover

More Information
Summary:Methods, apparatus, and articles of manufacture to collect process control data are disclosed. An example method to collect process control data includes registering an electronic device description describing a parameter to be measured and a measurement sampling rate, measuring the parameter based on the measurement sampling rate, storing data representative of the measured parameter in a data structure, and transferring data in the data structure to a first process control device via a process control network in response to at least one of a request for the data, a condition associated with the data, or an event associated with the data.
Bibliography:Application Number: US20100878739