ATOMIC MAGNETOMETER AND MAGNETIC SENSING METHOD

An atomic magnetometer includes a light source for a probe beam and a medium in which the probe beam is to be propagated. The medium is a substance which changes a polarization rotation angle of the probe beam depending on a magnetic field intensity at a first measurement position and a magnetic fie...

Full description

Saved in:
Bibliographic Details
Main Authors SUGIOKA HIDEYUKI, ICHIHARA SUNAO
Format Patent
LanguageEnglish
Published 11.08.2011
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:An atomic magnetometer includes a light source for a probe beam and a medium in which the probe beam is to be propagated. The medium is a substance which changes a polarization rotation angle of the probe beam depending on a magnetic field intensity at a first measurement position and a magnetic field intensity at a second measurement position different from the first measurement position. The atomic magnetometer directly measures a difference between the magnetic field intensity at the first measurement position and the magnetic field intensity at the second measurement position as a difference in polarization rotation angle, along a propagation path of the probe beam.
Bibliography:Application Number: US20080740059