METHODS FOR ASSESSING A TEMPERATURE IN A SUBSURFACE FORMATION

Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated...

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Bibliographic Details
Main Authors BRADFORD GRAHAM PATRICK, DE ST. REMEY EDWARD EVERETT, BURNS DAVID BOOTH, GESUALDI ERIC ABREU, ARORA DHRUV, BASS RONALD MARSHALL, NGUYEN SCOTT VINH, THOMPSON STEPHEN TAYLOR
Format Patent
LanguageEnglish
Published 09.06.2011
Subjects
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Summary:Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated conductor based on the one or more assessed dielectric properties.
Bibliography:Application Number: US20100901257