TUNING A PROCESS CONTROLLER BASED ON A DYNAMIC SAMPLING RATE

A method for estimating a state of a process implemented by a tool for fabricating workpieces includes collecting metrology data associated with a subset of workpieces processed in the tool. The collecting exhibits an irregular pattern. Metrology data associated with a selected state observation is...

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Bibliographic Details
Main Authors STIRTON J. BROC, PABST DETLEF, GOOD RICHARD P
Format Patent
LanguageEnglish
Published 02.12.2010
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Summary:A method for estimating a state of a process implemented by a tool for fabricating workpieces includes collecting metrology data associated with a subset of workpieces processed in the tool. The collecting exhibits an irregular pattern. Metrology data associated with a selected state observation is received for a selected run of the process. A tuning factor for the selected run is determined based on the irregular pattern. The selected state observation is discounted based on the determined tuning factor. A state estimate of the process is determined based on the discounted selected state observation. At least one process tool operable to implement the process is controlled based on the state estimate.
Bibliography:Application Number: US20090472624