APPARATUS AND METHOD FOR MEASURING TOTAL LUMINOUS FLUX

In a total luminous flux measurement apparatus according to an embodiment, a total luminous flux emitted by an object is calculated based on a result of measuring illuminances using a measuring unit when providing relative movement between the object and an integrating unit to expose a substantially...

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Bibliographic Details
Main Authors MISHIMA SHUNSUKE, OHKUBO KAZUAKI
Format Patent
LanguageEnglish
Published 25.11.2010
Subjects
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:In a total luminous flux measurement apparatus according to an embodiment, a total luminous flux emitted by an object is calculated based on a result of measuring illuminances using a measuring unit when providing relative movement between the object and an integrating unit to expose a substantially entire light emitting surface of the object to an inner space of the integrating unit. Specifically, under conditions that the object is disposed to penetrate the integrating unit from one sample hole to the other sample hole, a luminous flux of a portion of the object within the inner space of the integrating unit is measured, then the integrating unit is moved relative to the object, and a luminous flux of a portion accordingly contained in the inner space of the integrating unit is measured.
Bibliography:Application Number: US20100779045