DEVICE FOR MEASURING TEMPERATURE AND LEAKAGE CURRENT IN A CHIP

Device for measuring temperature and leakage current in a chip, which provides an output which linearly varies with the temperature. The device comprises a leakage inverter and an electronic module which digitalizes and linearizes the non-linear output of the leakage inverter. When providing a linea...

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Bibliographic Details
Main Authors LOPEZ VALLEJO MARISA, AYALA RODRIGO JOSE LUIS, ITUERO HERRERO PABLO
Format Patent
LanguageEnglish
Published 28.10.2010
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:Device for measuring temperature and leakage current in a chip, which provides an output which linearly varies with the temperature. The device comprises a leakage inverter and an electronic module which digitalizes and linearizes the non-linear output of the leakage inverter. When providing a linear response, the need for storage and data interconnection is reduced, besides the numeric representation thereof is facilitated. The device can be used to measure temperature variations inside a chip and also to measure leakage current variations, which also entails measuring static power variations inside a chip.
Bibliography:Application Number: US20080670514