MULTI-LAYERED DETECTOR SYSTEM FOR HIGH RESOLUTION COMPUTED TOMOGRAPHY

X-ray detector system with improved spatial resolution for a computed tomography systems is provided. The detector system may include pairs of first and second detector arrays, with each array containing detector elements of a different design. In one embodiment, the first array may comprise a first...

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Bibliographic Details
Main Author TKACZYK JOHN ERIC
Format Patent
LanguageEnglish
Published 07.10.2010
Subjects
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Summary:X-ray detector system with improved spatial resolution for a computed tomography systems is provided. The detector system may include pairs of first and second detector arrays, with each array containing detector elements of a different design. In one embodiment, the first array may comprise a first, relatively thin and continuous (i.e., monolithic) scintillation layer with an array of individual diodes positioned to receive light generated within the scintillation layer. The second array may comprise a second, relatively thick scintillation layer formed of separate scintillator elements. An array of diodes may be positioned to receive radiation from the scintillation layer such that each diode element is aligned to primarily receive radiation from one scintillator element in the layer. The structural arrangements of the detector system may also be adapted for applications involving direct conversion of x-ray energy.
Bibliography:Application Number: US20100750159