METHODS AND APPARATUS TO TEST AND COMPENSATE MULTI-CHANNEL DIGITAL-TO-ANALOG CONVERTERS

Methods and apparatus to test and compensate multi-channel digital-to-analog converters (DACs) are described. In some examples, a multi-channel digital-to-analog converter (DAC) and an error detector are implemented in an integrated circuit. The multi-channel DAC includes a first DAC channel configu...

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Bibliographic Details
Main Authors DATTA RAMYANSHU, PAGLIERI ALESSANDRO, BARR CHRISTOPHER MICHAEL
Format Patent
LanguageEnglish
Published 01.07.2010
Subjects
BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
DECODING
ELECTRICITY
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Summary:Methods and apparatus to test and compensate multi-channel digital-to-analog converters (DACs) are described. In some examples, a multi-channel digital-to-analog converter (DAC) and an error detector are implemented in an integrated circuit. The multi-channel DAC includes a first DAC channel configured to generate a first analog representation of a digital input signal, and a second DAC channel configured to generate a second analog representation of the digital input signal. The error detector is configured to compare the first analog representation and the second analog representation to generate a difference signal, and to output a signal indicative of whether the difference signal is greater than a predetermined threshold.
Bibliography:Application Number: US20080345230