EDGE ETCHED SILICON WAFERS

The present disclosure generally relates to the manufacture of silicon wafers, and more particularly to edge etching apparatus and methods for etching the edge of a silicon wafer.

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Bibliographic Details
Main Authors DOANE THOMAS E, SCHMIDT JUDITH A, ERK HENRY F, HOLLANDER EUGENE R, ALBRECHT PETER D, VANDAMME ROLAND R, ZHANG GUOQIANG (DAVID)
Format Patent
LanguageEnglish
Published 01.10.2009
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Summary:The present disclosure generally relates to the manufacture of silicon wafers, and more particularly to edge etching apparatus and methods for etching the edge of a silicon wafer.
Bibliography:Application Number: US20090415555