METHOD FOR ANALYZING CIRCUIT

A method for analyzing circuit comprises the steps of selecting a plurality of elements; sampling the selected elements, resulting in a plurality of sampling-parameter sets; simulating the sampling-parameter sets to generate a plurality of simulation-results, and process the regression operation for...

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Bibliographic Details
Main Authors LEE TAING, CHANG HSIN-LAN, CHEN SHENG-YOW
Format Patent
LanguageEnglish
Published 14.05.2009
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A method for analyzing circuit comprises the steps of selecting a plurality of elements; sampling the selected elements, resulting in a plurality of sampling-parameter sets; simulating the sampling-parameter sets to generate a plurality of simulation-results, and process the regression operation for the sampling-parameter sets and simulation-results in order to acquire the contribution rank of each sampling-parameter set and element. Accordingly, while analyzing similar circuits, the partial elements can be selected according to the contribution rank and further sampled; thereby, the amount of sampling-parameter sets can be advantageously reduced, and the analysis efficiency can be improved according to the circuit.
Bibliography:Application Number: US20080267194