Mechanical Enhancement of Dense and Porous Organosilicate Materials by UV Exposure

Low dielectric materials and films comprising same have been identified for improved performance when used as interlevel dielectrics in integrated circuits as well as methods for making same. In one aspect of the present invention, an organosilicate glass film is exposed to an ultraviolet light sour...

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Main Authors BITNER MARK DANIEL, KARWACKI, JR. EUGENE JOSEPH, VINCENT JEAN LOUISE, LUKAS AARON SCOTT, O'NEILL MARK LEONARD, VRTIS RAYMOND NICHOLAS
Format Patent
LanguageEnglish
Published 26.02.2009
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Summary:Low dielectric materials and films comprising same have been identified for improved performance when used as interlevel dielectrics in integrated circuits as well as methods for making same. In one aspect of the present invention, an organosilicate glass film is exposed to an ultraviolet light source wherein the film after exposure has an at least 10% or greater improvement in its mechanical properties (i.e., material hardness and elastic modulus) compared to the as-deposited film.
Bibliography:Application Number: US20080262879