METHOD TO ENHANCE MICRO-C4 RELIABILITY BY REDUCING THE IMPACT OF HOT SPOT PULSING

A system for reducing an impact of hot spot, pulsing of a semiconductor device including: first generating means for generating a plurality of local op-codes; a sequencer for augmenting customer op-codes with the plurality of local op-codes; selecting means for selecting one or more of the randomly...

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Bibliographic Details
Main Authors KNICKERBOCKER JOHN U, MCVICKER GERARD, SRI-JAYANTHA SRI M
Format Patent
LanguageEnglish
Published 13.11.2008
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:A system for reducing an impact of hot spot, pulsing of a semiconductor device including: first generating means for generating a plurality of local op-codes; a sequencer for augmenting customer op-codes with the plurality of local op-codes; selecting means for selecting one or more of the randomly arriving customer op-codes awaiting execution; monitoring means for tracking which of the one or more randomly arriving customer op-codes have been selected; separating means for separating the plurality of local op-codes from the one or more customer op-codes; storing means for storing one or more data related to the processing of the plurality of local op-codes and the customer op-codes; and second generating means for generating an output for a customer corresponding to that customer op-code while gainfully employing an output generated by local op-codes for system health monitoring purpose.
Bibliography:Application Number: US20070745172