APPARATUS AND METHOD FOR MODEL-BASED CONTROL

Various methods and systems for the parametric control of a process include representing the process with a process model used to generate future predictions of a process variable. In one embodiment, the process exhibits integrating behavior that is represented by a non-integrating process model. In...

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Bibliographic Details
Main Authors BROSILOW COLEMAN B, HAJI-VALIZADEH ALIREZA, PARVEZ SHAHID, NAGLE JOHN T, CHIA TIEN-LI, LEFKOWITZ IRVING
Format Patent
LanguageEnglish
Published 16.10.2008
Subjects
CALCULATING
COMPUTING
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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Summary:Various methods and systems for the parametric control of a process include representing the process with a process model used to generate future predictions of a process variable. In one embodiment, the process exhibits integrating behavior that is represented by a non-integrating process model. In another embodiment, an inverse of the model is filtered using a filter that includes a lead time constant that is selected to minimize a steady state error of the predicted process variable. In yet another embodiment, an array of output model values is revised or reindexed in response to a change in a time-varying parameter related to the process.
Bibliography:Application Number: US20070734980