Non-volatile two-transistor semiconductor memory cell and method for producing the same
The invention relates to a nonvolatile semiconductor memory cell and to an associated fabrication method, a source region ( 7 ), a drain region ( 8 ) and a channel region lying in between being formed in a substrate ( 1 ). In order to realize locally delimited memory locations (LB, RB), an electrica...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
24.07.2008
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Subjects | |
Online Access | Get full text |
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Summary: | The invention relates to a nonvolatile semiconductor memory cell and to an associated fabrication method, a source region ( 7 ), a drain region ( 8 ) and a channel region lying in between being formed in a substrate ( 1 ). In order to realize locally delimited memory locations (LB, RB), an electrically non-conductive charge storage layer ( 3 ) situated on a first insulation layer ( 2 ) is divided by an interruption (U), thereby preventing, in particular, a lateral charge transport between the memory locations (LB, RB) and significantly improving the charge retention properties. |
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Bibliography: | Application Number: US20080079003 |