SENSOR ARRANGEMENTS FOR WAFER CENTER FINDING
A number of wafer center finding methods and systems are disclosed herein that improve upon existing techniques used in semiconductor manufacturing.
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
19.06.2008
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Subjects | |
Online Access | Get full text |
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Summary: | A number of wafer center finding methods and systems are disclosed herein that improve upon existing techniques used in semiconductor manufacturing. |
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Bibliography: | Application Number: US20080032405 |