Semiconductor devices the include a fuse part including an antifuse and protection circuit
A semiconductor device includes a fuse part including an antifuse that is connected between a first common node to which a high voltage that is higher than an internal boost voltage is applied and a first node. The fuse part is enabled in response to a program mode selection signal and an address si...
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Main Author | |
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Format | Patent |
Language | English |
Published |
21.02.2008
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device includes a fuse part including an antifuse that is connected between a first common node to which a high voltage that is higher than an internal boost voltage is applied and a first node. The fuse part is enabled in response to a program mode selection signal and an address signal so as to fuse the antifuse in response to the high voltage applied to the first common node and to set a voltage level of a second node. A latch circuit is configured to latch an output signal responsive to the voltage level of the second node when the fuse part is in a fused state. A protection circuit is configured to lower a voltage level at the first node when the fuse part is not enabled and the high voltage is applied to the first common node. |
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Bibliography: | Application Number: US20070800635 |